The HP 4191A permits reliable measurements over a wide measuring range. Its outstanding repeatability, frequency response and accuracy are made possible by unique error correction capability and specially designed test fixtures. These features allow the HP 4191A to be used in evaluation of electronic materials, components and circuitry.
The internal synthesizer provides a maximum resolution of 100 Hz (Opt 002) with an accuracy of 3 ppm, allowing small changes in the resonant frequency of the device under test to be easily detected. The swept frequency capability aids in the analysis of frequency characteristics of the device.
Two complete front panel settings (parameter selection and the sweep control) can be stored in a non-volatile memory and recalled at any time with a single key operation. This, together with the standard HP-IB interface, makes the HP 4191 A extremely efficient either as a stand-alone or systems instrument.
These unique features permit very wide applications in: (1) semiconductor testing such as surface state evaluation at high frequencies (C-V /G-V and conductance (G/ww) characteristics), and the input/output impedance evaluation of diodes and transistors, (2) resonator, filter, and magnetic and dielectric materials testing, (3) evaluation of LCR components such as high frequency chip and leaded components, and (4) testing of communications related components such as cables, connectors, etc.