The Agilent Mobile Communications dc Sources offer a built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes (such as talk mode, active mode, standby mode, and off/sleep mode). Measurements made during these modes are critical for ensuring that your devices are operating properly and that you are getting the most out of the battery.
Single output models are recommended when you need to provide power as a replacement to your devices main battery during testing. Dual output models are recommended when you need to provide power as a replacement to your devices main battery and when you need to simulate the battery charger power; Use one output to supply current to the battery charger input port and the second output to connect in place of the main battery (which sinks current to simulate the main battery being charged).
With their battery emulation features, the Agilent 66319B/D and 66321B/D allow you to test your devices under the same power conditions that exist in actual use. Emulating the battery is key when characterizing battery operating life and detecting early product failures. These dc sources simulate the effects of internal resistance of the battery, enabling them to emulate the operation of various battery types or batteries in different charge states. Plus, these dc sources can simulate negative resistance so that you can compensate for voltage drop due to wiring in a fixture.
Agilent has designed in the capability and flexibility that is required for accurately testing todays communications devices as well as your next generation designs for cell phones (formats include: 3G, cdma2000, WCDMA, CDMA, TDMA, GSM, PCS, DECT, TETRA, PHS, NADC), PDAs, BluetoothTM enabled devices, and Wireless LAN access devices.
The new and improved 66319B/D and 66321B/D high performance models are recommended for new automated test system platforms and for R+D applications. The 66309B/D and the 66311B/D are available for those customers who need to replicate existing test platforms and who do not want to re-engineer existing automated test system designs.