The latest technological advances in fundamental oscillator design provide up to 20 GHz of frequency coverage with superior harmonic suppression and no subharmonics. When this excellent spurious performance is combined with high-output power capabilities, high-measurement dynamic range is achieved.
The HP 83750 synthesized sweepers provide superior accuracy and stability while maintaining the speed of analog sources. Fully-synthesized CW, stepped, and ramp sweep modes are available in broadband and narrowband operation. The synthesis capabilities are particularly useful for the characterization of narrowband devices, in which the frequency instabilities of open-loop sources become most apparent.
Excellent output-power flatness and accuracy can be translated to the input port of the device-under-test with the power flatness correction feature of these sources. This feature uses a power meter to create an array of power corrections that compensate for power variations in the measurement path between the source and the test device.
Swept testing of frequency translation devices can be achieved simply and economically with the HP 83570 series synthesized sweepers. A traditionally difficult measurement, sweeping the RF and local oscillator (LO) input ports at a fixed offset over a wide frequency span, is easy to implement with superior frequency accuracy by positioning two synchro- nously tracking HP 83750s in a two-tone configuration. With broadband frequency coverage and excellent performance, the HP 83750 synthesized sweepers are ideal stimuli for frequency translation measurements.
The HP 83750 series make optimal companion sources for scalar- measurement applications. Full compatibility is available via the HP 8757 system interface bus. The HP 8757D scalar analyzer and HP 83750 series have a complementary design that achieves superior frequency accuracy, power accuracy, and flatness while significantly reducing measurement uncertainty. In addition, the HP 83750s high-power and low-harmonic capabilities increase the spurious-free measurement dynamic range of scalar systems. Ten independent, continuously variable markers and a marker sweep function allow fast, efficient analysis of the test device at or between critical measurement frequencies. CW, stepped, ramp, or power sweep modes are available for device characterization. A 25 dB power sweep range is particularly useful for compression measurements of active devices such as amplifiers and mixers.
The high-power models HP 83751B and 83752B provide +17 dBm output power with 20 dBc harmonics from 2 to 20 GHz. This high- power capability eliminates the need to externally amplify the signal for test devices that require high-input power levels. When Option 1EE (source module interface connector and extension cable) is added, these sources can directly drive the HP 83550 series mm-wave source modules to provide waveguide frequency coverage up to 110 GHz. All HP 83750 sweepers with Option 1EE automatically provide bias, power flatness correction, and internal leveling for the HP 83550 series source modules.
HP 83750 sweepers offer two operating languages to ensure com- patibility with instruments today and in the future. The default language is SCPI (Standard Command for Programmable Instruments), an industry standard. The second operating language employs HP 8350 mnemonics to provide programming compatibility with HP 8350-based measure- ment systems.
HP 83751A 2 to 20 GHz Synthesized Sweeper
HP 83751B 2 to 20 GHz Synthesized Sweeper (High Power)
HP 83752A 0.01 to 20 GHz Synthesized Sweeper.
HP 83752B 0.01 to 20 GHz Synthesized Sweeper (High Power)