- 300KHz - 1.5GHZ frequency range
- 115dB dynamic range
- 0.005dB rms trace noise
- T/R or S-parameter test sets
- 50 or 75 ohm impedance
The ENA-L offers all of the critical performance and features needed in R+D, manufacturing, and service to test RF components such as: filters, amplifiers, antennas, cables, CATV taps, and distribution amplifiers.
The affordably priced ENA-L, equipped with the core functions of the industry-standard ENA, includes many easy-to-use features and is optimized for efficient measurements and high reliability.
The ENA-L, with its 115 dB dynamic range and 0.005 dB rms trace noise, provides the accuracy and speed required for many network measurement applications. The wide 30 kHz IF bandwidth (IFBW) and powerful digital processing provide unprecedented measurement speed. The S-parameter test set options offer full two-port calibration for optimum accuracy (Option 250 or 275).
Power sweep and three types of frequency functions provide effective analysis to suit your application needs such as:.
Power sweep to analyze active devices such as amplifiers.
Linear sweep to evaluate narrow-band devices such as filters.
Log sweep to evaluate broadband devices such as cables.
Segment sweep allows you to tailor the sweep condition with up to 201 sweep segments.
Display up to four traces per measurement channel and evaluate all four S-parameters of a two-port device at the same time. Each of the ENA-Ls four measurement channels can have independent measurement settings such as frequency range, enabling you to compare traces with different measurement conditions. In total, the ENA-L allows you to display and analyze 16 traces simultaneously!.
Unlike the traditional mechanical calibration technique, Keysights optional ECal modules only require one set of connections to perform full two-port calibration (controlled through the front panel USB port). The ENA-L controls the ECal module to perform the entire calibration to provide:
Faster calibration and reduced complexity.
Reduced chance of operator error.
Reduced wear on connectors.
Quickly switch between different test conditions simply by recalling an instrument state. With the ENA-Ls easy to use interface, recalling an instrument state is as easy as using a softkey.
Eliminate the guesswork and facilitate pass/fail judgement with limit-line testing to increase the reliability and productivity of your test processes. Limit-line conditions can be easily defined by editing the spreadsheet on the analyzer display.