- 9KHz - 3GHz frequenct range
- -130dBm noise floor
- 10Hz - 1MHz RBW
- Sweep times down to <10ms
- Numerous built-in measurements
The accuracy of frequency selective power measurements when characterizing your products is very important. With a newly featured digital IF, the N9320B enables dramatic improvements in power measurement accuracy.
Power meter functionality is also built-in with Keysight U2000 series power sensor support for highly accurate RF and MW power measurements.
The built-in 1-button power measurement suite offers channel power, ACP, OBW, SEM and TOI measurements.
For automated test programming, the N9320B provides industy standard SCPI language support and flexible connectivity choices with USB, LAN. Plus, SCPI code compatibility with Keysight ESA-L series for easy instrument replacement.
In your RD, QA or university research lab, you want to know as much measurement detail as possible about your products and designs . The N9320B offers the best-in-class spectrum visibility. The 10 Hz minimum RBW distinguishes closely spaced signals easily, the -148 dBm DANL reveals low level signals clearly, and combined with the 4 trace display and 12 markers allows you easily identify and compare signal details.
One of the best ways to improve students learning efficiency for RF related curriculums is to combine lectures with hands-on labs. The N9320B is an excellent price-performance fit for educational purposes. Whether you wish to combine the N9320B analyzer with the Keysight N9310A RF signal generator for basic RF concept labs, or enhance your RF circuit labs with the N9320B and its optional RF training kit (option code:N9320B-TR1), you will find adopting Keysights RF education solution efficient and effective.
Regardless of whether you are manufacturing a wireless mouse, keyboards, GPS devices, or RF components such as mixers, filters or amplifiers, you need to measure their RF characteristics to insure they work properly within their design parameters like frequency bandwidth and output power range. Too little RF power may decrease the wireless operating distance, while too much power can drain batteries quickly, reducing operation time and cause excessive heat in the device.
The throughput rate of a test station is generally one of the key factors limiting the productivity of a manufacturing line. You almost always want to test your products in the shortest possible time. The sweep time of a spectrum analyzer is often the most important performance specification contributing to your RF analysis test time. The N9320B analyzer provides you with 10 ms non-zero span sweep time, the fastest in its class.
The N9320B equipped with a new digital IF section tests your product with improved frequency and amplitude accuracy and stability. It provides essential information for your products performance and characteristics with increased confidence.
When you find yourself having repeatedly to make the same type of complex measurement or measurement sequence, it is useful to know that some shortcuts are available. Thats what is provided for you in the N9320B spectrum analyzer.
The N9320B spectrum analyzer continues the Keysight tradition that test equipment should be easy to set up and simple to use. Those familiar with other Keysight spectrum analyzers will find a similar user interface in the N9320B, allowing for a shorter learning curve and easier operation.
One button auto-tuning allows you to quickly find and accurately analyze the highest level signal anywhere in the analyzers frequency range. Centering this signal on the screen, the analyzer simultaneously optimizes the frequency span, resolution and video bandwidths, auto-scales the amplitude, sets a marker on the signal peak and displays the measurement results.
You will find that the one-button power measurement suite shortens routine test set up time by simplifying the keypad/menu selection. Selecting these one-button routines directly from the softkey menu also helps ensure accuracy and repeatability of the test set up and measurement no matter who presses the button.
One of the most fundamental measurements performed by spectrum analyzers is the frequency domain measurement of RF power. However, detailed analysis of a signal often requires standards-defined spectral masks or more complex power/bandwidth/detector measurement combinations. Precise, rapid integrated channel power with computed power spectral density utilizing from the RMS averaging detector. Selecting the percentage of the signals power to be measured places markers at the upper and lower frequencies of the waveform representing the bandwidth utilized by that percentage of power.
Fast, accurate simultaneous filtered RMS power measurement of a carrier relative to its leakage in up to six offset bands or channels.
The spectrum emission mask (SEM) is a set of complex limit lines forming a mask for out-of-channel emissions measurement. The SEM is defined relatively to in-channel power.
You can set the parameters of the main channel, out of channel frequency bands and the limit lines. Included is Pass/Fail testing for the overall spectrum emission mask and each individual out-of- channel frequency range.
Of course, you retain the flexibility to tailor each measurement task to your specific needs when necessary. And youll find it easy to distinguish between signals having large level differences since the N9320B has one of the widest dynamic ranges for an analyzer in its price range.
The N9320B now supports high accuracy, USB plug-and-play power measurements as standard when connected to an Keysight U2000 series USB power sensor. Make true average power measurements for all signal types with wide dynamic range up to 18 GHz with just the push of a button. The Keysight U2000 series USB power sensors require no external power supplies and with internal zeroing eliminate the need for external calibration. Without the need for additional boxes, the user can easily set up, calibrate and control the power sensor via the analyzers USB port. Two display modes are available: either the meter or the chart mode to log power measurements over time.