Keysight (Agilent/HP) E8358A 9GHz Vector Network Analyser

Keysight (Agilent/HP) E8358A 9GHz Vector Network Analyser Description:

• 300KHz - 9GHz frequency range
• 128dB dynamic range
• -85 to +10dBm source power range
• 0.002dB rms trace noise
• 35us/point measurement speed

The Keysight (Agilent/HP) E8358A is a member of the PNA series of vector network analyzers. The Keysight (Agilent/HP) PNA series offers the highest performance among vector network analyzers. The series offers exceptional speed, dynamic range, accuracy, and configurability that can reduce time to market in R+D or maximize throughput in manufacturing. These analyzers enable engineers who design and test high-performance RF components to quickly and easily make measurements and then analyze and communicate the results.

Agilents PNA series of vector network analyzers offer unparalleled measurement capabilities to better characterize your high-performance components. With their combination of 9 GHz frequency coverage, fast sweep speeds, exceptional dynamic range, low trace noise, four measurement receivers, and direct receiver access, you will have all the power and flexibility you need for almost any RF application.

The PNA series comes in 3, 6, or 9 GHz models (E8356A, E8357A, E8358A, respectively). Using the widest bandwidth and 1601 points, you get measurements at 35 s/ point. This speed does not come at the expense of trace noise. The 35 kHz IF bandwidth boasts an impressively low trace noise of 0.004 dB RMS. The result is very accurate measurements of low-loss devices. With direct access to measurement receivers, you can measure up to 143 dB of dynamic range. This increased measurement range enables clear, precise measurements of base station filters or LNA receiver/ filter combinations.

The PNA series provides additional accuracy through TRL / TRM calibration. The series uses four mixer-based receivers so you can utilize true TRL / TRM calibration for accurate in-fixture and on wafer measurements.

The time-domain option (Option 010) allows you to locate and resolve discontinuities in devices, fixtures, or cables. Once located, unwanted responses can be removed using the gating function. Option 010 also furnishes a very simple and deterministic technique to tune cavity-resonator filters.

Option 015 provides a configurable test set for maximum flexibility.

Front panel access to the RF signal path allows for customization within the test set. You can configure the signal path for up to 143 dB of dynamic range at the test port with full 2 -port error correction. In order to achieve this dynamic range, simply reverse the coupler for increased dynamic range in one direction and use segment sweep mode.

The PNA series achieves new levels of connectivity. There are many methods of communication to and from the instrument, using a variety of built-in I/O interfaces. Windows 2000 lets you take advantage of many features you take for granted on your personal computer, helping you attain a new level of integration for your device-measurement process.

For local storage, use the analyzers internal hard disk drive or connect a compatible CD read/write drive. In addition, using drive mapping and the LAN interface, you can save data directly to remote PCs or file servers. This arrangement makes it very easy to develop statistical-process-controlled manufacturing environments.

The PNA series allows a number of ways to connect and control other test equipment such as power meters or signal sources. You can choose to connect them via the available USB, GPIB, LAN, serial, or parallel interfaces. When utilizing any one of your Windows-supported automation tools, you can control the test equipment directly from the analyzer. The LAN interface also makes it easy to perform remote troubleshooting. You can review measurement results and control the analyzer from anywhere on the network , whether you are on another floor, in another building, or even at a different site. .

For manufacturing environments, test automation is essential for high throughput. For R D, automated tests can save considerable time that might be spent on repetitive and tedious measurements. The PNA series lets you automate your test processes using several powerful automation approaches. You can create programs using familiar SCPI commands via the GPIB or LAN interfaces, or use COM commands over LAN for fast analyzer access. The analyzers firmware interfaces with many programmable objects, or automation entry points, that respond quickly and directly to COM statements.

COM programming mak es it easier for you to reuse your test code on multiple computer software and hardware platforms, and makes the actual source code much easier to understand and debug. COM can also give you a significant speed advantage. In some instances, COM-based programs can execute the same instrument settings and transfer data about four times faster than using SCPI. Moreover, programs can be executed internally on the network analyzer or externally on your PC .

Decreasing test time is often critical for success in manufacturing environments. The PNA series has many attributes that help you accomplish your throughput goals. The outstanding performance of the analyzers starts with exceptionally fast sweeps that do not sacrifice performance. For instance, measurements that require 120 dB (at 401 points, 300 Hz IF bandwidth) of instrument dynamic range, the PNA series sweep speed is only 1.2 seconds.

If you set up your device measurement with a segmented sweep, the analyzer will only measure the device response at the frequency segments that you define. Not only do you control the start and stop frequencies of individual segments, but also the number of points, IF bandwidth, and source power level. This means you can skip data where you do not need it, and have high frequency resolution only where you do need it, such as in the passband of your filters.

Another feature that speeds production testing is pass/fail testing using limit lines. Let the network analyzer quickly determine if the device meets the measurement limits you have defined. A PASS/FAIL indicator on the screen means operators do not have to interpret results.

For devices that once required two to four instrument setups for complete characterization, the PNA series ability to have up to four measurement channels, each with its own stimulus and response parameters, can also improve your test throughput. When using Agilents electronic calibration (ECaL ) modules, you can dramatically reduce the time it tak es to perform calibrations. Simply connect the module to your test ports and let the analyzer control and measure all the standards necessary for full two-port calibrations.

These modules are driven directly from the analyzer via a USB connection and controlled via firmware.